Calibration Method for Confocal X-Ray Microanalysis with Polychromatic Excitation

X-ray microanalysis attachment for electron microscope.

Fundamental Constants for Quantitative X-ray Microanalysis.

Quantitative X-ray microanalysis requires the use of many fundamental constants related to the interaction of the electron beam with the sample. The current state of our knowledge of such constants in the particular areas of electron stopping power, X-ray ionization cross-sections, X-ray fluorescence yield, and the electron backscattering yield, is examined. It is found that, in every case, the...

X-Ray microanalysis of stratified specimens

This paper presents a description of the state of the art methodology and software for the application of x-ray microanalysis to thin surface layers and more generally to the characterization of stratified specimens. The sensitivity of the technique to near-surface segregation is demonstrated. Some emphasis is given on the eS(pz) function (the distribution in depth of the primary generated x-ra...

Energy calibration of energy-resolved photon-counting pixel detectors using laboratory polychromatic x-ray beams

Recently, photon-counting detectors capable of resolving incident x-ray photon energies have been considered for use in spectral x-ray imaging applications. For reliable use of energy-resolved photon-counting detectors (ERPCDs), energy calibration is an essential procedure prior to their use because variations in responses from each pixel of the ERPCD for incident photons, even at the same ener...

Towards Beam Hardening Correction for Polychromatic X-ray Ct

High-attenuation object-induced streaking and shadow artifacts in computerized tomography (CT) are somewhat connected to the misfit of the X-ray projection data to the range space of the Radon transform. This misfit is mainly due to the beam hardening factor of the projection data which is unavoidable for polychromatic sources. The major difficulty in dealing with the beam hardening-induced str...